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We hope this email find you well and safe in this difficult time we are going through. In this eNews we provide an article by Certus Semiconductor Inc regarding:
HBM Pin Combinations in standard JS-001 2017
Introduction
In this post we will discuss the updated pin combinations available in the HBM standard JS-001 2017 and the motivations for those pin combinations. Unless you are familiar with the traditional HBM pin combinations I would suggest that you read the traditional pin combination blog before continuing the current blog.
Issues with Traditional HBM Pin Combinations
The traditional pin combinations, as presented in Table 2B of JS-001 2017, were developed in the 1980s. Even at that time it was recognized that stressing each pin versus every other pin one at a time would create very long test times. To create a more reasonable set of pin combination the traditional pin combinations were developed. The traditional pin combinations are in Table 2B of JS-001 and are reproduced in Table 1 below. In Table 2B each power supply domain was attached to terminal B (ground side) and all other pins were stressed to that pin one at a time. After cycling though all of the power supply domains being connected to the B terminal, each non-supply pin was stressed versus all other supply pins tied together. The traditional pin combinations kept test times to reasonable levels, and they served the industry very well for many years. Over the last 20 years, however, pin counts have continued to increase and, in some ways even more significant, the number of power supply domains have increased dramatically on some high pin count devices.
There are three basic issues with the traditional pin combinations in today’s high pin count devices:
Long test times for devices with large numbers of power supply domains
Repeated stressing of specific protection structures which can lead to wear out Tests which almost never result in failures
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